REDDY RAMALINGA REDDY, Roopesh Kumar. Predictive Reliability Engineering for IoT Devices Using Deep Learning-Driven Telemetry Analytics and Observability-First SRE Methodologies. American International Journal of Computer Science and Technology, India., v. 6, n. 6, p. 43–56, 2024. DOI: 10.63282/3117-5481/AIJCST-V6I6P105. Disponível em: https://aijcst.org/index.php/aijcst/article/view/155. Acesso em: 8 feb. 2026.